Matches in DBpedia 2016-04 for { <http://dbpedia.org/resource/Automatic_test_pattern_generation> ?p ?o }
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- Automatic_test_pattern_generation abstract "ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, and in some cases to assist with determining the cause of failure (failure analysis.) The effectiveness of ATPG is measured by the amount of modeled defects, or fault models, that are detected and the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration. It is influenced by the fault model under consideration, the type of circuit under test (full scan, synchronous sequential, or asynchronous sequential), the level of abstraction used to represent the circuit under test (gate, register-transfer, switch), and the required test quality.".
- Automatic_test_pattern_generation wikiPageExternalLink www.date-conference.com.
- Automatic_test_pattern_generation wikiPageExternalLink www.ieee-ets.org.
- Automatic_test_pattern_generation wikiPageExternalLink www.itctestweek.org.
- Automatic_test_pattern_generation wikiPageExternalLink www.tttc-vts.org.
- Automatic_test_pattern_generation wikiPageID "374448".
- Automatic_test_pattern_generation wikiPageLength "12956".
- Automatic_test_pattern_generation wikiPageOutDegree "37".
- Automatic_test_pattern_generation wikiPageRevisionID "695869557".
- Automatic_test_pattern_generation wikiPageWikiLink Algorithm.
- Automatic_test_pattern_generation wikiPageWikiLink Application-specific_integrated_circuit.
- Automatic_test_pattern_generation wikiPageWikiLink Automatic_test_equipment.
- Automatic_test_pattern_generation wikiPageWikiLink Boolean_difference.
- Automatic_test_pattern_generation wikiPageWikiLink Boolean_satisfiability_problem.
- Automatic_test_pattern_generation wikiPageWikiLink Category:Electronic_circuit_verification.
- Automatic_test_pattern_generation wikiPageWikiLink Combinational_logic.
- Automatic_test_pattern_generation wikiPageWikiLink Controllability.
- Automatic_test_pattern_generation wikiPageWikiLink Design_for_testing.
- Automatic_test_pattern_generation wikiPageWikiLink Digital_electronics.
- Automatic_test_pattern_generation wikiPageWikiLink Electronic_design_automation.
- Automatic_test_pattern_generation wikiPageWikiLink FAN_Algorithm.
- Automatic_test_pattern_generation wikiPageWikiLink Failure_analysis.
- Automatic_test_pattern_generation wikiPageWikiLink Fault_coverage.
- Automatic_test_pattern_generation wikiPageWikiLink Fault_model.
- Automatic_test_pattern_generation wikiPageWikiLink Literal_proposition.
- Automatic_test_pattern_generation wikiPageWikiLink NP-completeness.
- Automatic_test_pattern_generation wikiPageWikiLink Observability.
- Automatic_test_pattern_generation wikiPageWikiLink P_versus_NP_problem.
- Automatic_test_pattern_generation wikiPageWikiLink Prabhu_Goel.
- Automatic_test_pattern_generation wikiPageWikiLink Pseudorandomness.
- Automatic_test_pattern_generation wikiPageWikiLink Scan_chain.
- Automatic_test_pattern_generation wikiPageWikiLink Sequential_logic.
- Automatic_test_pattern_generation wikiPageWikiLink State_space.
- Automatic_test_pattern_generation wikiPageWikiLink Stuck-at_fault.
- Automatic_test_pattern_generation wikiPageWikiLink Suresh_kumar_Devanathan.
- Automatic_test_pattern_generation wikiPageWikiLink VHSIC.
- Automatic_test_pattern_generation wikiPageWikiLink Very-large-scale_integration.
- Automatic_test_pattern_generation wikiPageWikiLinkText "Automatic test pattern generation".
- Automatic_test_pattern_generation wikiPageWikiLinkText "automated".
- Automatic_test_pattern_generation wikiPageWikiLinkText "automatic test pattern generation".
- Automatic_test_pattern_generation wikiPageWikiLinkText "sequential pattern generation".
- Automatic_test_pattern_generation wikiPageWikiLinkText "test pattern generators".
- Automatic_test_pattern_generation wikiPageWikiLinkText "test patterns".
- Automatic_test_pattern_generation wikiPageUsesTemplate Template:Cite_book.
- Automatic_test_pattern_generation wikiPageUsesTemplate Template:Main.
- Automatic_test_pattern_generation wikiPageUsesTemplate Template:Overline.
- Automatic_test_pattern_generation subject Category:Electronic_circuit_verification.
- Automatic_test_pattern_generation hypernym Technology.
- Automatic_test_pattern_generation type Company.
- Automatic_test_pattern_generation type Redirect.
- Automatic_test_pattern_generation comment "ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.".
- Automatic_test_pattern_generation label "Automatic test pattern generation".
- Automatic_test_pattern_generation sameAs Q837455.
- Automatic_test_pattern_generation sameAs Generazione_di_programmi_di_prova_automatici.
- Automatic_test_pattern_generation sameAs m.020vkj.
- Automatic_test_pattern_generation sameAs ATPG.
- Automatic_test_pattern_generation sameAs Q837455.
- Automatic_test_pattern_generation sameAs ATPG.
- Automatic_test_pattern_generation wasDerivedFrom Automatic_test_pattern_generation?oldid=695869557.
- Automatic_test_pattern_generation isPrimaryTopicOf Automatic_test_pattern_generation.