Matches in DBpedia 2016-04 for { <http://citation.dbpedia.org/hash/e7109dd14a2dd04747721260c4be1d0b4b68f3282d8be6d1c46e45553a24f0bf> ?p ?o }
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- e7109dd14a2dd04747721260c4be1d0b4b68f3282d8be6d1c46e45553a24f0bf author2 "Press, R.".
- e7109dd14a2dd04747721260c4be1d0b4b68f3282d8be6d1c46e45553a24f0bf booktitle "Microelectronics Failure Analysis".
- e7109dd14a2dd04747721260c4be1d0b4b68f3282d8be6d1c46e45553a24f0bf first "G".
- e7109dd14a2dd04747721260c4be1d0b4b68f3282d8be6d1c46e45553a24f0bf isCitedBy Automatic_test_pattern_generation.
- e7109dd14a2dd04747721260c4be1d0b4b68f3282d8be6d1c46e45553a24f0bf last "Crowell".
- e7109dd14a2dd04747721260c4be1d0b4b68f3282d8be6d1c46e45553a24f0bf pages "132–8".
- e7109dd14a2dd04747721260c4be1d0b4b68f3282d8be6d1c46e45553a24f0bf title "Using Scan Based Techniques for Fault Isolation in Logic Devices".