Matches in DBpedia 2016-04 for { <http://books.google.com/books?vid=ISBN0-87170-804-3> ?p ?o }
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- books?vid=ISBN0-87170-804-3 booktitle "Microelectronics Failure Analysis".
- books?vid=ISBN0-87170-804-3 displayAuthors "etal".
- books?vid=ISBN0-87170-804-3 first "D.".
- books?vid=ISBN0-87170-804-3 first "E.".
- books?vid=ISBN0-87170-804-3 first "J.".
- books?vid=ISBN0-87170-804-3 first "Nicholas".
- books?vid=ISBN0-87170-804-3 first "S.".
- books?vid=ISBN0-87170-804-3 first1 "Ed".
- books?vid=ISBN0-87170-804-3 first1 "F".
- books?vid=ISBN0-87170-804-3 first2 "R".
- books?vid=ISBN0-87170-804-3 first3 "P".
- books?vid=ISBN0-87170-804-3 first4 "C".
- books?vid=ISBN0-87170-804-3 isCitedBy Automatic_test_pattern_generation.
- books?vid=ISBN0-87170-804-3 isCitedBy CAD_navigation.
- books?vid=ISBN0-87170-804-3 isCitedBy Charge-induced_voltage_alteration.
- books?vid=ISBN0-87170-804-3 isCitedBy Electron_beam-induced_current.
- books?vid=ISBN0-87170-804-3 isCitedBy Electron_beam_prober.
- books?vid=ISBN0-87170-804-3 isCitedBy Laser_voltage_prober.
- books?vid=ISBN0-87170-804-3 isCitedBy Light-induced_voltage_alteration.
- books?vid=ISBN0-87170-804-3 isCitedBy Optical_beam-induced_current.
- books?vid=ISBN0-87170-804-3 isCitedBy Semiconductor_fault_diagnostics.
- books?vid=ISBN0-87170-804-3 isCitedBy Thermal_laser_stimulation.
- books?vid=ISBN0-87170-804-3 isCitedBy Time-domain_reflectometer.
- books?vid=ISBN0-87170-804-3 isbn "0-87170-804-3".
- books?vid=ISBN0-87170-804-3 journal "Microelectronics Failure Analysis".
- books?vid=ISBN0-87170-804-3 last "Antoniou".
- books?vid=ISBN0-87170-804-3 last "Cole".
- books?vid=ISBN0-87170-804-3 last "Kolachina".
- books?vid=ISBN0-87170-804-3 last "Smolyansky".
- books?vid=ISBN0-87170-804-3 last "Thong".
- books?vid=ISBN0-87170-804-3 last1 "Beaudoin".
- books?vid=ISBN0-87170-804-3 last1 "Cole".
- books?vid=ISBN0-87170-804-3 last2 "Desplats".
- books?vid=ISBN0-87170-804-3 last3 "Perdu".
- books?vid=ISBN0-87170-804-3 last4 "Boit".
- books?vid=ISBN0-87170-804-3 location "Materials Park, Ohio".
- books?vid=ISBN0-87170-804-3 pages "289–302".
- books?vid=ISBN0-87170-804-3 pages "406–407".
- books?vid=ISBN0-87170-804-3 pages "408–411".
- books?vid=ISBN0-87170-804-3 pages "417–425".
- books?vid=ISBN0-87170-804-3 pages "426–430".
- books?vid=ISBN0-87170-804-3 pages "438–443".
- books?vid=ISBN0-87170-804-3 place "Materials Park".
- books?vid=ISBN0-87170-804-3 publisher "ASM International".
- books?vid=ISBN0-87170-804-3 title "Beam-Based Defect Localization Methods".
- books?vid=ISBN0-87170-804-3 title "Electron Beam Probing".
- books?vid=ISBN0-87170-804-3 title "Electronic Package Fault Isolation Using TDR".
- books?vid=ISBN0-87170-804-3 title "Introduction to Laser Voltage Probing of Integrated Circuits".
- books?vid=ISBN0-87170-804-3 title "Microelectronics Failure Analysis".
- books?vid=ISBN0-87170-804-3 title "Principles of Thermal Laser Stimulation Techniques".
- books?vid=ISBN0-87170-804-3 title "The Process of Editing Circuits Through the Bulk Silicon".
- books?vid=ISBN0-87170-804-3 year "2004".