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- Wafer_testing abstract "Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test patterns to them. The wafer testing is performed by a piece of test equipment called a wafer prober. The process of wafer testing can be referred to in several ways: Wafer Final Test (WFT), Electronic Die Sort (EDS) and Circuit Probe (CP) are probably the most common.".
- Wafer_testing thumbnail Wafer_prober_service_configuration.jpg?width=300.
- Wafer_testing wikiPageID "1085127".
- Wafer_testing wikiPageLength "5850".
- Wafer_testing wikiPageOutDegree "20".
- Wafer_testing wikiPageRevisionID "683438504".
- Wafer_testing wikiPageWikiLink Automatic_test_pattern_generation.
- Wafer_testing wikiPageWikiLink Bond_characterization.
- Wafer_testing wikiPageWikiLink CPU_cache.
- Wafer_testing wikiPageWikiLink Category:Semiconductor_device_fabrication.
- Wafer_testing wikiPageWikiLink Chip-scale_package.
- Wafer_testing wikiPageWikiLink Contact_pad.
- Wafer_testing wikiPageWikiLink Die_attachment.
- Wafer_testing wikiPageWikiLink Die_preparation.
- Wafer_testing wikiPageWikiLink Fabrication_(semiconductor).
- Wafer_testing wikiPageWikiLink Infrared_thermal_microscopy.
- Wafer_testing wikiPageWikiLink Integrated_circuit.
- Wafer_testing wikiPageWikiLink Integrated_circuit_packaging.
- Wafer_testing wikiPageWikiLink Integrated_circuits.
- Wafer_testing wikiPageWikiLink Non-contact_wafer_testing.
- Wafer_testing wikiPageWikiLink Probe_card.
- Wafer_testing wikiPageWikiLink Semiconductor_device_fabrication.
- Wafer_testing wikiPageWikiLink Semiconductor_fabrication.
- Wafer_testing wikiPageWikiLink Substrate_mapping.
- Wafer_testing wikiPageWikiLink Test_program.
- Wafer_testing wikiPageWikiLink Wafer_bonding.
- Wafer_testing wikiPageWikiLink Wafer_prober.
- Wafer_testing wikiPageWikiLink Wafer_testing.
- Wafer_testing wikiPageWikiLink File:Wafer_prober_service_configuration.jpg.
- Wafer_testing wikiPageWikiLinkText "Wafer testing".
- Wafer_testing wikiPageWikiLinkText "prober".
- Wafer_testing wikiPageWikiLinkText "tests the chips on the wafer".
- Wafer_testing wikiPageWikiLinkText "wafer test".
- Wafer_testing wikiPageWikiLinkText "wafer testing".
- Wafer_testing hasPhotoCollection Wafer_testing.
- Wafer_testing wikiPageUsesTemplate Template:Reflist.
- Wafer_testing subject Category:Semiconductor_device_fabrication.
- Wafer_testing hypernym Step.
- Wafer_testing type MilitaryConflict.
- Wafer_testing type Process.
- Wafer_testing type Semiconductor.
- Wafer_testing comment "Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test patterns to them. The wafer testing is performed by a piece of test equipment called a wafer prober.".
- Wafer_testing label "Wafer testing".
- Wafer_testing sameAs m.044p6k.
- Wafer_testing sameAs Тестовая_структура.
- Wafer_testing sameAs Q4456480.
- Wafer_testing sameAs Q4456480.
- Wafer_testing wasDerivedFrom Wafer_testing?oldid=683438504.
- Wafer_testing depiction Wafer_prober_service_configuration.jpg.
- Wafer_testing isPrimaryTopicOf Wafer_testing.