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- Stuck-at_fault abstract "A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an output is tied to a logical 1 state during test generation to assure that a manufacturing defect with that type of behavior can be found with a specific test pattern. Likewise the output could be tied to a logical 0 to model the behavior of a defective circuit that cannot switch its output pin.Not all faults can be analyzed using the stuck-at fault model. Compensation for static hazards, namely branching signals, can render a circuit untestable using this model. Also, redundant circuits cannot be tested using this model, since by design there is no change in any output as a result of a single fault.".
- Stuck-at_fault wikiPageID "2438898".
- Stuck-at_fault wikiPageLength "4767".
- Stuck-at_fault wikiPageOutDegree "16".
- Stuck-at_fault wikiPageRevisionID "670480520".
- Stuck-at_fault wikiPageWikiLink Automatic_test_pattern_generation.
- Stuck-at_fault wikiPageWikiLink CMOS.
- Stuck-at_fault wikiPageWikiLink Category:Digital_electronics.
- Stuck-at_fault wikiPageWikiLink Category:Electronic_design_automation.
- Stuck-at_fault wikiPageWikiLink Design_For_Test.
- Stuck-at_fault wikiPageWikiLink Design_for_testing.
- Stuck-at_fault wikiPageWikiLink Digital_circuits.
- Stuck-at_fault wikiPageWikiLink Digital_electronics.
- Stuck-at_fault wikiPageWikiLink Fault_coverage.
- Stuck-at_fault wikiPageWikiLink Fault_model.
- Stuck-at_fault wikiPageWikiLink Iddq_testing.
- Stuck-at_fault wikiPageWikiLink Integrated_circuit.
- Stuck-at_fault wikiPageWikiLink NAND_gate.
- Stuck-at_fault wikiPageWikiLink Negated_AND_gate.
- Stuck-at_fault wikiPageWikiLink OR_gate.
- Stuck-at_fault wikiPageWikiLink Serendipity.
- Stuck-at_fault wikiPageWikiLink Transistor–transistor_logic.
- Stuck-at_fault wikiPageWikiLink XOR_gate.
- Stuck-at_fault wikiPageWikiLinkText "Stuck-at fault".
- Stuck-at_fault wikiPageWikiLinkText "stuck-at fault".
- Stuck-at_fault hasPhotoCollection Stuck-at_fault.
- Stuck-at_fault wikiPageUsesTemplate Template:Unreferenced.
- Stuck-at_fault subject Category:Digital_electronics.
- Stuck-at_fault subject Category:Electronic_design_automation.
- Stuck-at_fault hypernym Model.
- Stuck-at_fault type Article.
- Stuck-at_fault type Person.
- Stuck-at_fault type Article.
- Stuck-at_fault comment "A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an output is tied to a logical 1 state during test generation to assure that a manufacturing defect with that type of behavior can be found with a specific test pattern.".
- Stuck-at_fault label "Stuck-at fault".
- Stuck-at_fault sameAs ماندن_در_حالت_خطا.
- Stuck-at_fault sameAs m.07d2d2.
- Stuck-at_fault sameAs Q7627418.
- Stuck-at_fault sameAs Q7627418.
- Stuck-at_fault wasDerivedFrom Stuck-at_fault?oldid=670480520.
- Stuck-at_fault isPrimaryTopicOf Stuck-at_fault.