Matches in DBpedia 2015-10 for { <http://dbpedia.org/resource/Device_under_test> ?p ?o }
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- Device_under_test abstract "Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing.".
- Device_under_test wikiPageID "5102157".
- Device_under_test wikiPageLength "1800".
- Device_under_test wikiPageOutDegree "16".
- Device_under_test wikiPageRevisionID "679614676".
- Device_under_test wikiPageWikiLink Automatic_test_equipment.
- Device_under_test wikiPageWikiLink Bed_of_nails_tester.
- Device_under_test wikiPageWikiLink Category:Electronic_engineering.
- Device_under_test wikiPageWikiLink Category:Hardware_testing.
- Device_under_test wikiPageWikiLink Category:Semiconductor_device_fabrication.
- Device_under_test wikiPageWikiLink DUT_board.
- Device_under_test wikiPageWikiLink Die_(integrated_circuit).
- Device_under_test wikiPageWikiLink In-circuit_test.
- Device_under_test wikiPageWikiLink Packaged_part.
- Device_under_test wikiPageWikiLink Pogo_pin.
- Device_under_test wikiPageWikiLink Semiconductor_curve_tracer.
- Device_under_test wikiPageWikiLink Semiconductor_package.
- Device_under_test wikiPageWikiLink Semiconductor_testing.
- Device_under_test wikiPageWikiLink System_under_test.
- Device_under_test wikiPageWikiLink Test_equipment.
- Device_under_test wikiPageWikiLink Wafer_(electronics).
- Device_under_test wikiPageWikiLink Zero_insertion_force.
- Device_under_test wikiPageWikiLinkText "DUT (device under test)".
- Device_under_test wikiPageWikiLinkText "DUT".
- Device_under_test wikiPageWikiLinkText "Device under test".
- Device_under_test wikiPageWikiLinkText "EUT".
- Device_under_test wikiPageWikiLinkText "capacitor under test".
- Device_under_test wikiPageWikiLinkText "device under test".
- Device_under_test wikiPageWikiLinkText "devices under test".
- Device_under_test wikiPageWikiLinkText "hardware testing".
- Device_under_test wikiPageWikiLinkText "tested devices".
- Device_under_test wikiPageWikiLinkText "unit under test (UUT)".
- Device_under_test wikiPageWikiLinkText "unit under test".
- Device_under_test hasPhotoCollection Device_under_test.
- Device_under_test wikiPageUsesTemplate Template:Reflist.
- Device_under_test wikiPageUsesTemplate Template:Tech-stub.
- Device_under_test wikiPageUsesTemplate Template:Unreferenced.
- Device_under_test subject Category:Electronic_engineering.
- Device_under_test subject Category:Hardware_testing.
- Device_under_test subject Category:Semiconductor_device_fabrication.
- Device_under_test hypernym Term.
- Device_under_test type Article.
- Device_under_test type Article.
- Device_under_test type Discipline.
- Device_under_test type Process.
- Device_under_test type Semiconductor.
- Device_under_test comment "Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing.".
- Device_under_test label "Device under test".
- Device_under_test sameAs Device_Under_Test.
- Device_under_test sameAs m.0d2qpn.
- Device_under_test sameAs Q1206780.
- Device_under_test sameAs Q1206780.
- Device_under_test sameAs 被测器件.
- Device_under_test wasDerivedFrom Device_under_test?oldid=679614676.
- Device_under_test isPrimaryTopicOf Device_under_test.