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- Ballistic_electron_emission_microscopy abstract "Ballistic electron emission microscopy or BEEM is a technique for studying ballistic electron transport through a variety of materials and material interfaces. BEEM is a three terminal scanning tunneling microscopy (STM) technique that was invented in 1988 at the Jet Propulsion Laboratory in Pasadena, California by L. Douglas Bell and William Kaiser. The most popular interfaces to study are metal-semiconductor Schottky diodes, but metal-insulator-semiconductor systems can be studied as well. When performing BEEM, electrons are injected from a STM tip into a grounded metal base of a Schottky diode. A small fraction of these electrons will travel ballistically through the metal to the metal-semiconductor interface where they will encounter a Schottky barrier. Those electrons with sufficient energy to surmount the Schottky barrier will be detected as the BEEM current. The atomic scale positioning capability of the STM tip gives BEEM nanometer spatial resolution. In addition, the narrow energy distribution of electrons tunneling from the STM tip gives BEEM a high energetic resolution (about 0.02 eV).".
- Ballistic_electron_emission_microscopy wikiPageID "17526233".
- Ballistic_electron_emission_microscopy wikiPageRevisionID "602723643".
- Ballistic_electron_emission_microscopy hasPhotoCollection Ballistic_electron_emission_microscopy.
- Ballistic_electron_emission_microscopy subject Category:American_inventions.
- Ballistic_electron_emission_microscopy subject Category:Scanning_probe_microscopy.
- Ballistic_electron_emission_microscopy type Ability105616246.
- Ballistic_electron_emission_microscopy type Abstraction100002137.
- Ballistic_electron_emission_microscopy type AmericanInventions.
- Ballistic_electron_emission_microscopy type Cognition100023271.
- Ballistic_electron_emission_microscopy type Creativity105624700.
- Ballistic_electron_emission_microscopy type Invention105633385.
- Ballistic_electron_emission_microscopy type PsychologicalFeature100023100.
- Ballistic_electron_emission_microscopy comment "Ballistic electron emission microscopy or BEEM is a technique for studying ballistic electron transport through a variety of materials and material interfaces. BEEM is a three terminal scanning tunneling microscopy (STM) technique that was invented in 1988 at the Jet Propulsion Laboratory in Pasadena, California by L. Douglas Bell and William Kaiser. The most popular interfaces to study are metal-semiconductor Schottky diodes, but metal-insulator-semiconductor systems can be studied as well.".
- Ballistic_electron_emission_microscopy label "Ballistic electron emission microscopy".
- Ballistic_electron_emission_microscopy sameAs Ballistische_Elektronenemissionsmikroskopie.
- Ballistic_electron_emission_microscopy sameAs m.0465wvm.
- Ballistic_electron_emission_microscopy sameAs Q4851791.
- Ballistic_electron_emission_microscopy sameAs Q4851791.
- Ballistic_electron_emission_microscopy sameAs Ballistic_electron_emission_microscopy.
- Ballistic_electron_emission_microscopy wasDerivedFrom Ballistic_electron_emission_microscopy?oldid=602723643.
- Ballistic_electron_emission_microscopy isPrimaryTopicOf Ballistic_electron_emission_microscopy.