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- 1.1616653 accessdate "2012-04-17".
- 1.1616653 author2 "C.S Thakur".
- 1.1616653 author3 "K Shalini".
- 1.1616653 author4 "N Bhat".
- 1.1616653 author5 "S.A Shivashankar".
- 1.1616653 date "2003-02-03".
- 1.1616653 doi "10.1063/1.1616653".
- 1.1616653 first "M.P".
- 1.1616653 isCitedBy Erbium(III)_oxide.
- 1.1616653 issue "14".
- 1.1616653 journal "Applied Physics Letters".
- 1.1616653 last "Singh".
- 1.1616653 pages "2889".
- 1.1616653 title "Structural and electrical characterization of erbium oxide films grown on Si by low-pressure metalorganic chemical vapor deposition".
- 1.1616653 url "http://apl.aip.org/resource/1/applab/v83/i14/p2889_s1?isAuthorized=no".
- 1.1616653 volume "83".