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DBpedia 2016-04

Query DBpedia 2016-04 by triple pattern

Matches in DBpedia 2016-04 for { ?s ?p "IEEE Transactions on Pattern Analysis and Machine Intelligence is a monthly peer-reviewed scientific journal published by the IEEE Computer Society. It covers research in computer vision and image understanding, pattern analysis and recognition, and machine intelligence. machine learning, search techniques, document and handwriting analysis, medical image analysis, video and image sequence analysis, content-based retrieval of image and video, and face and gesture recognition. The editor-in-chief is David A. Forsyth (University of Illinois). According to the Journal Citation Reports, the journal has a 2013 impact factor of 5.694."@en }

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