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- Reliability_(semiconductor) abstract "Reliability of semiconductor devices can be summarized as follows: Semiconductor devices are very sensitive to impurities and particles. Therefore, to manufacture these devices it is necessary to manage many processes while accurately controlling the level of impurities and particles. The finished product quality depends upon the many layered relationship of each interacting substance in the semiconductor, including metallization, chip material (list of semiconductor materials) and package. The problems of micro-processes, and thin films and must be fully understood as they apply to metallization and wire bonding. It is also necessary to analyze surface phenomena from the aspect of thin films. Due to the rapid advances in technology, many new devices are developed using new materials and processes, and design calendar time is limited due to non-recurring engineering constraints, plus time to market concerns. Consequently, it is not possible to base new designs on the reliability of existing devices. To achieve economy of scale, semiconductor products are manufactured in high volume. Furthermore, repair of finished semiconductor products is impractical. Therefore, incorporation of reliability at the design stage and reduction of variation in the production stage have become essential. Reliability of semiconductor devices may depend on assembly, use, and environmental conditions. Stress factors affecting device reliability include gas, dust, contamination, voltage, current density, temperature, humidity, mechanical stress, vibration, shock, radiation, pressure, and intensity of magnetic and electrical fields.Design factors affecting semiconductor reliability include: voltage derating, power derating, current derating, metastability, logic timing margins (logic simulation), timing analysis, temperature derating, and process control.".
- Reliability_(semiconductor) wikiPageExternalLink rej27l0001_reliabilityhb.pdf.
- Reliability_(semiconductor) wikiPageExternalLink 4.PDF.
- Reliability_(semiconductor) wikiPageExternalLink rs&h.htm.
- Reliability_(semiconductor) wikiPageExternalLink www.eurelnet.org.
- Reliability_(semiconductor) wikiPageID "20575536".
- Reliability_(semiconductor) wikiPageLength "7182".
- Reliability_(semiconductor) wikiPageOutDegree "51".
- Reliability_(semiconductor) wikiPageRevisionID "677399057".
- Reliability_(semiconductor) wikiPageWikiLink Automotive_Electronics_Council.
- Reliability_(semiconductor) wikiPageWikiLink Burn-in.
- Reliability_(semiconductor) wikiPageWikiLink Category:Semiconductor_device_fabrication.
- Reliability_(semiconductor) wikiPageWikiLink Cleanroom.
- Reliability_(semiconductor) wikiPageWikiLink Cleanrooms.
- Reliability_(semiconductor) wikiPageWikiLink Dust.
- Reliability_(semiconductor) wikiPageWikiLink Economies_of_scale.
- Reliability_(semiconductor) wikiPageWikiLink Economy_of_scale.
- Reliability_(semiconductor) wikiPageWikiLink Electric_current.
- Reliability_(semiconductor) wikiPageWikiLink Electric_power.
- Reliability_(semiconductor) wikiPageWikiLink Electrical.
- Reliability_(semiconductor) wikiPageWikiLink Electricity.
- Reliability_(semiconductor) wikiPageWikiLink Electromigration.
- Reliability_(semiconductor) wikiPageWikiLink Electrostatic_discharge.
- Reliability_(semiconductor) wikiPageWikiLink Failure_analysis.
- Reliability_(semiconductor) wikiPageWikiLink Field-effect_transistor.
- Reliability_(semiconductor) wikiPageWikiLink Fracture.
- Reliability_(semiconductor) wikiPageWikiLink Gas.
- Reliability_(semiconductor) wikiPageWikiLink HIRF.
- Reliability_(semiconductor) wikiPageWikiLink Humidity.
- Reliability_(semiconductor) wikiPageWikiLink Injection_molding.
- Reliability_(semiconductor) wikiPageWikiLink Injection_moulding.
- Reliability_(semiconductor) wikiPageWikiLink Latch-up.
- Reliability_(semiconductor) wikiPageWikiLink List_of_materials-testing_resources.
- Reliability_(semiconductor) wikiPageWikiLink List_of_materials_analysis_methods.
- Reliability_(semiconductor) wikiPageWikiLink List_of_semiconductor_materials.
- Reliability_(semiconductor) wikiPageWikiLink Logic_simulation.
- Reliability_(semiconductor) wikiPageWikiLink Magnetic.
- Reliability_(semiconductor) wikiPageWikiLink Magnetism.
- Reliability_(semiconductor) wikiPageWikiLink Mechanical_stress.
- Reliability_(semiconductor) wikiPageWikiLink Metallizing.
- Reliability_(semiconductor) wikiPageWikiLink Metastability.
- Reliability_(semiconductor) wikiPageWikiLink Non-recurring_engineering.
- Reliability_(semiconductor) wikiPageWikiLink Ohmic_contact.
- Reliability_(semiconductor) wikiPageWikiLink Overcurrent.
- Reliability_(semiconductor) wikiPageWikiLink Overvoltage.
- Reliability_(semiconductor) wikiPageWikiLink Pressure.
- Reliability_(semiconductor) wikiPageWikiLink Process_control.
- Reliability_(semiconductor) wikiPageWikiLink Radiation.
- Reliability_(semiconductor) wikiPageWikiLink Semiconductor.
- Reliability_(semiconductor) wikiPageWikiLink Shock_(mechanics).
- Reliability_(semiconductor) wikiPageWikiLink Static_timing_analysis.
- Reliability_(semiconductor) wikiPageWikiLink Stress_(mechanics).
- Reliability_(semiconductor) wikiPageWikiLink Temperature.
- Reliability_(semiconductor) wikiPageWikiLink Thin_film.
- Reliability_(semiconductor) wikiPageWikiLink Thin_films.
- Reliability_(semiconductor) wikiPageWikiLink Time_to_market.
- Reliability_(semiconductor) wikiPageWikiLink Timing_analysis.
- Reliability_(semiconductor) wikiPageWikiLink Vibration.
- Reliability_(semiconductor) wikiPageWikiLink Voltage.
- Reliability_(semiconductor) wikiPageWikiLink Wafer_prober.
- Reliability_(semiconductor) wikiPageWikiLink Wafer_testing.
- Reliability_(semiconductor) wikiPageWikiLink Wire_bonding.
- Reliability_(semiconductor) wikiPageWikiLinkText "Reliability (semiconductor)".
- Reliability_(semiconductor) wikiPageWikiLinkText "reliability of semiconductors".
- Reliability_(semiconductor) wikiPageWikiLinkText "reliability".
- Reliability_(semiconductor) hasPhotoCollection Reliability_(semiconductor).
- Reliability_(semiconductor) wikiPageUsesTemplate Template:Citation.
- Reliability_(semiconductor) wikiPageUsesTemplate Template:Reflist.
- Reliability_(semiconductor) subject Category:Semiconductor_device_fabrication.
- Reliability_(semiconductor) comment "Reliability of semiconductor devices can be summarized as follows: Semiconductor devices are very sensitive to impurities and particles. Therefore, to manufacture these devices it is necessary to manage many processes while accurately controlling the level of impurities and particles. The finished product quality depends upon the many layered relationship of each interacting substance in the semiconductor, including metallization, chip material (list of semiconductor materials) and package.".
- Reliability_(semiconductor) label "Reliability (semiconductor)".
- Reliability_(semiconductor) sameAs m.051xsx7.
- Reliability_(semiconductor) sameAs Q7310987.
- Reliability_(semiconductor) sameAs Q7310987.
- Reliability_(semiconductor) sameAs 半导体器件可靠性.
- Reliability_(semiconductor) wasDerivedFrom Reliability_(semiconductor)?oldid=677399057.
- Reliability_(semiconductor) isPrimaryTopicOf Reliability_(semiconductor).