DBpedia – Linked Data Fragments

DBpedia 2016-04

Query DBpedia 2016-04 by triple pattern

Matches in DBpedia 2016-04 for { ?s ?p "The use of Automatic test system switching test equipment allows for high-speed testing of a device or devices in a test situation, where strict sequences and combinations of switching must be observed. By automating the process in this way, the possibility of test errors and inaccuracies is minimized, and only systematic errors would generally be encountered due to such as an incorrect programmed test condition."@en }

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